Your search returned 13 records. Click on the hyperlinks to view further details of Titles..
Magazine Name : Ieee Design And Test Of Computers
Year : 1997Volume number : 13Issue:03
Microprocessor Architectuer Design With Atlas.(Article) Subject:
Author:
Danko
Basch
Mario
Zogar
page:
104
-
112
A Bist And Boundary-Scan Economic Framework.(Article) Subject:
Author:
Magdy
Abadir
Tony
Ambler
page:
17
-
23
Incorporating Cost Modeling In Embedded - System Design.(Article) Subject:
Cost Modeling
Author:
Anthony J
Gadient
Vijay K
Modisetti
James A
Debardelaben
page:
24
-
35
Analyzing Manufacturing Test Costs.(Article) Subject:
Analyzing Test Costs
Author:
Craig T
Pynn
page:
36
-
40
Test Economic In The 21st Century.(Article) Subject:
Author:
Jon
Turino
page:
41
-
44
Cost-Driven Ranking Of Memory Elements For Partial Intrusion.(Article) Subject:
Author:
Magdy
Abadir
Rohit
Kapur
page:
45
-
50
The Economics Of System-Level Testing.(Article) Subject:
Author:
Tony
Ambler
Des
Farren
page:
51
-
58
Ic Failure Analysis: Magic, Mystery, And Science.(Article) Subject:
Author:
Christorpher L
Henderson
Richard E
Anderson
Jerry M
Soden
page:
59
-
69
Diagnosing Ic Failures In A Fast Environment.(Article) Subject:
Author:
Donald
Staab
Eugene R
Hanatek
page:
70
-
75
Ic Failure Analysis: The Importance Of Test And Diagnostics.(Article) Subject:
Author:
David P
Vallett
page:
76
-
82
Antomated Diagnosis In Testing And Failure Analysis.(Article) Subject:
Author:
Jeff
Platt
Karl
Johnson
page:
83
-
89
Shmoo Plotting: The Black Art Of Ic Testing.(Article) Subject:
Author:
Jos Van
Beers
Keith
Baker
page:
90
-
97
Modeling The Unmodelabe: Algorithm Fault Diagnosis.(Article) Subject:
Author:
Robert C
Aitken
page:
98
-
103